Bidirectional Nonlinear Optical Tomography: Unbiased Characterization of Off- and On-Chip Coupling Efficiencies
Published in arXiv:2510.13110, 2025
We present bidirectional nonlinear optical tomography (BNOT), a hardware-compatible metrology that breaks the degeneracy of input and output coupling efficiencies to enable unbiased benchmarking of nonlinear photonic integrated circuits.
Recommended citation: Bo-Han Wu, Mahmoud Jalali Mehrabad, Dirk Englund. (2025). arXiv preprint arXiv:2510.13110.
Download Paper
